ZMI-2002 8020-0211-1-J Specification:

Series: ZMI-2000

Function: A biaxial measurement board used to measure surface morphology and contour.

Light source: 666 nm laser.

Sensor: CMOS array.

Resolution:<1 nm.

Measurement range:

X-axis: 50 mm

Y-axis: 25 mm.

Accuracy: ± 0.1 µ m.

Working temperature: 0 ° C to+40 ° C.

Protection level: IP54.

Dimensions: 239 x 114 x 29 mm.

Weight: 1.2 kg.

ZMI-2002 8020-0211-1-J Features:

Multi axis design:

Two interferometric measurement axes are provided on a single board, suitable for application scenarios that require simultaneous monitoring of multiple axes.

Simplified interface:

This measurement board has a simplified P2 interface, allowing single or multiple boards to be easily connected to a single servo card or motor controller via bus.

High sampling rate:

Equipped with advanced signal processing functions, providing high sampling rates and the ability to capture rapidly changing signals in real time.

Wide input range:

Wide input range, capable of processing various analog and digital signals.

Easy to expand:

The design is easy to expand and can accommodate multiple axes at the same rate, meeting the needs of more complex systems.

Stability and reliability:

Even in harsh environments, its powerful power supply ensures stable and reliable operation.

ZMI-2002 8020-0211-1-J Application areas:

Optical flatness measurement: used to measure the flatness of optical components.

Wavefront analysis: used to analyze the wavefront characteristics of optical systems.

Thin film thickness measurement: used to measure the thickness of thin films.

Monitoring of position, speed, and force: suitable for applications that require simultaneous processing and monitoring of multiple physical quantities.

Laser processing and measurement: suitable for various laser processing and measurement applications.

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